Development of measuring magnetic Compton profiles by grazing incidence geometry

A novel technique of measuring a magnetic Compton profile using the grazing angle geometry against a sample surface (Grazing Incidence Magnetic Compton Profile) has been successively developed. Measurements of a magnetic moment and a magnetic Compton profile are possible for a Fe 200 nm film on a th...

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Bibliographic Details
Published in:The Journal of physics and chemistry of solids 2004-12, Vol.65 (12), p.2083-2088
Main Authors: Sakurai, Hiroshi, Itoh, Fumitake, Ota, Minoru, Takano, Katsuyoshi, Liu, Xioxi, Oike, Hiromi, Kawata, Hiroshi
Format: Article
Language:English
Subjects:
A. Multilayers
B. Vapour deposition
Condensed matter: electronic structure, electrical, magnetic, and optical properties
D. Electronic structure
Exact sciences and technology
Magnetic properties and materials
Magnetic properties of monolayers and thin films
Magnetic properties of surface, thin films and multilayers
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Other interactions of matter with particles and radiation
Physics
X-ray scattering
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Summary:A novel technique of measuring a magnetic Compton profile using the grazing angle geometry against a sample surface (Grazing Incidence Magnetic Compton Profile) has been successively developed. Measurements of a magnetic moment and a magnetic Compton profile are possible for a Fe 200 nm film on a thick glass substrate. The estimated thinnest limit for measurements is 100 nm for a Fe film.
ISSN:0022-3697
1879-2553
DOI:10.1016/j.jpcs.2004.08.024