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The influence of thickness on magnetic properties of nanostructured nickel thin films obtained by GLAD technique

[Display omitted] •Obtaining Ni vertical posts using glancing angle deposition technique.•Detailed characterization of Ni thin films by SEM, AFM, XRD, XPS and MOKE methods.•The variation of structural, chemical and magnetic properties with thickness.•Longitudinal and polar magnetization component wa...

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Bibliographic Details
Published in:Materials research bulletin 2016-12, Vol.84, p.455-461
Main Authors: Potočnik, J., Nenadović, M., Bundaleski, N., Jokić, B., Mitrić, M., Popović, M., Rakočević, Z.
Format: Article
Language:English
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Summary:[Display omitted] •Obtaining Ni vertical posts using glancing angle deposition technique.•Detailed characterization of Ni thin films by SEM, AFM, XRD, XPS and MOKE methods.•The variation of structural, chemical and magnetic properties with thickness.•Longitudinal and polar magnetization component was investigated. In this work, nickel (Ni) thin films were deposited by electron beam evaporation of Ni using Glancing Angle Deposition technique onto the glass substrate with the thickness varied from 25nm to 150nm. Characterization of obtained Ni films was performed by scanning electron microscopy (SEM), atomic force microscopy (AFM), X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS) and by Magneto-Optical Kerr effect measurements (MOKE). The effect of thickness on structural, chemical and magnetic properties of nickel films has been studied. Observed changes in microstructure were correlated with the variation in magnetic parameters obtained by MOKE measurements. It was found that for thinner Ni films, the enhancement of coercivity is due to the surface roughness of Ni films, while for thicker films the observed asymmetry of coercivity is due to the mechanism of column size growth.
ISSN:0025-5408
1873-4227
DOI:10.1016/j.materresbull.2016.08.044