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Ultrasonic vibration-induced amorphization in the Cu-Al interface

•Cu-Al cables effectively joined by ultrasonic welding.•Nanocrystal-amorphous mixed zone was found at the Cu/Al interface.•The asymmetry of diffusion favors the formation of amorphous regions.•Shear stresses induce the formation of amorphous phases. A ∼ 40 nm thick nanocrystal-amorphous mixed zone w...

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Bibliographic Details
Published in:Materials letters 2024-12, Vol.377, p.137442, Article 137442
Main Authors: Cheng, X.M., Yang, K., Wu, Y.F., Wang, J., Zhao, J.H.
Format: Article
Language:English
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Summary:•Cu-Al cables effectively joined by ultrasonic welding.•Nanocrystal-amorphous mixed zone was found at the Cu/Al interface.•The asymmetry of diffusion favors the formation of amorphous regions.•Shear stresses induce the formation of amorphous phases. A ∼ 40 nm thick nanocrystal-amorphous mixed zone was found at the Cu/Al interface induced by ultrasonic welding. It is believed that the formation of amorphous Cu/Al alloys is attributed to the local free energy increase and shear stresses during ultrasonic vibration. The lowering of the amorphization barrier is a prerequisite for ultrasonic vibration-induced interfacial amorphization, which is in intrinsic contrast to previously reported dislocation-mediated amorphization.
ISSN:0167-577X
DOI:10.1016/j.matlet.2024.137442