Modelling of Degraded Power MOSFET Effects on Inverter Static Parameters

In this study, electrical constant stress method which is one of accelerated tests is applied to power vertical double diffused MOSFETs continued up to 6hours. The stress induced changes of characteristic parameters (threshold voltage, mobility, etc.) of power MOSFETs are extracted. A resistive load...

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Bibliographic Details
Main Authors: Sezgin, Hatice Gül, Özçelep, Yasin
Format: Conference Proceeding
Language:English
Subjects:
Constant electrical stress
degradation modelling
static parameters of NMOS inverter
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Summary:In this study, electrical constant stress method which is one of accelerated tests is applied to power vertical double diffused MOSFETs continued up to 6hours. The stress induced changes of characteristic parameters (threshold voltage, mobility, etc.) of power MOSFETs are extracted. A resistive load NMOS inverter is set up and degraded power MOSFET effects on its static parameters are investigated experimentally. Besides the obtained experimental results, a simple circuit model is proposed to simulate the stress induced changes in NMOS inverter static parameters. In this manner, obtained experimental results are supported by simulation study. Proposed degradation model has ability to help designers to predict circuit reliability in the early stages of design.
ISSN:2214-7853
2214-7853
DOI:10.1016/j.matpr.2016.03.072