Structural and optical characterization of reactive evaporated Sn2Sb4Se8 thin films

The present report is a comprehensive characterization of the optical properties of tin antimony selenide (Sn2Sb4Se8) thin films prepared by reactive evaporation. Sn2Sb4Se8 is a common crystalline phase belonging to the Sn-Sb-Se ternary system or TAS system whose optical properties are not discussed...

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Bibliographic Details
Main Authors: Urmila, K.S., Bose, Lakshmi S.
Format: Conference Proceeding
Language:English
Subjects:
Optical properties
Reactive evaporation
Thin films
UV–Vis-NIR Spectroscopy
XRD
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Summary:The present report is a comprehensive characterization of the optical properties of tin antimony selenide (Sn2Sb4Se8) thin films prepared by reactive evaporation. Sn2Sb4Se8 is a common crystalline phase belonging to the Sn-Sb-Se ternary system or TAS system whose optical properties are not discussed in detail in literature. X-Ray Diffraction (XRD) confirms the polycrystalline nature of the as-prepared thin film. The film exhibited good photo response, high absorption coefficient ∼105 cm−1 and a direct band gap of 1.54 ± 0.02 eV. These factors point out its potential use as an absorber in thin film solar cells. The optical parameters of the film were also investigated to validate its use in optical devices. On further tailoring of optical properties, the Sn2Sb4Se8 thin film can be considered as a promising material for photovoltaic (PV) industry.
ISSN:2214-7853
2214-7853
DOI:10.1016/j.matpr.2022.01.104