Probabilistic diagnosis of clustered faults for shared structures

The probabilistic diagnosis model is useful in many fields such as distributed network, digital system level testing and wafer fault testing. Some topologies and continuous defect units distributions are studied in our previous work. In this paper, we extend the model to arbitrary topology structure...

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Bibliographic Details
Published in:Mathematical and computer modelling 2009-02, Vol.49 (3), p.623-634
Main Authors: Lu, Xiaojun, Li, Jianping, Seo, Chang-Jun
Format: Article
Language:English
Subjects:
Cluster fault
Exact sciences and technology
Mathematical analysis
Mathematics
Methods of scientific computing (including symbolic computation, algebraic computation)
Numerical analysis. Scientific computation
Performance analysis
Probabilistic diagnosis
Sciences and techniques of general use
Shared structure
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Summary:The probabilistic diagnosis model is useful in many fields such as distributed network, digital system level testing and wafer fault testing. Some topologies and continuous defect units distributions are studied in our previous work. In this paper, we extend the model to arbitrary topology structure with share nodes and to the discrete defect distributions, such as Poission distribution and Binomial distribution. The results show high identification percentage of the nodes.
ISSN:0895-7177
1872-9479
DOI:10.1016/j.mcm.2008.06.011