Characterisation of two p-type HPGe detectors by measurements and Monte Carlo simulations

•Modeling of two identical HPGe detectors was performed with manufacturer's data.•Optimum DL thickness makes experiments and simulations more compatible.•DL thickness is related to the age and history of each detector.•Vacuum degradation can cause increased dead layer thickness. This study aims...

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Bibliographic Details
Published in:Measurement : journal of the International Measurement Confederation 2022-11, Vol.204, p.112092, Article 112092
Main Authors: Uyar, Esra, Bölükdemir, Mustafa Hicabi
Format: Article
Language:English
Subjects:
Dead layer
Detector characterisation
DETEFF
GESPECOR
HPGe
PHITS
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Summary:•Modeling of two identical HPGe detectors was performed with manufacturer's data.•Optimum DL thickness makes experiments and simulations more compatible.•DL thickness is related to the age and history of each detector.•Vacuum degradation can cause increased dead layer thickness. This study aims to characterize two p-type HPGe detectors with the same geometric properties, which were put into operation 9 years ago by determining the optimum dead layer thickness. Experimental efficiencies were measured in the energy range of 81–1408 keV using point sources. As a result of simulations using general-purpose and specific-purpose Monte Carlo codes, optimized dead layer thicknesses, which were stated to be
ISSN:0263-2241
1873-412X
DOI:10.1016/j.measurement.2022.112092