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Transport and interface states in high-κ LaSiOx dielectric

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Bibliographic Details
Published in:	Microelectronic engineering 2011-07, Vol.88 (7), p.1342-1345
Main Authors:	GOMENIUK, Y. Y, GOMENIUK, Y. V, TYAGULSKII, I. P, TYAGULSKII, S. I, NAZAROV, A. N, LYSENKO, V. S, CHERKAOUI, K, MONAGHAN, S, HURLEY, P. K
Format:	Article
Language:	English
Subjects:	Applied sciences Compound structure devices Condensed matter: electronic structure, electrical, magnetic, and optical properties Dielectric thin films Dielectrics, piezoelectrics, and ferroelectrics and their properties Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Electronic transport in interface structures Electronic transport in multilayers, nanoscale materials and structures Electronics Exact sciences and technology Metal-insulator-semiconductor structures (including semiconductor-to-insulator) Physics Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
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