GTEM cell facility use during project development phases for automotive

• Published in: Microelectronics 2004-06, Vol.35 (6), p.563-569
• Main Authors: Maurice, Olivier, Daran, François de, Lafon, Frédéric, Oussedrat, Rabha, Ben Yacoub, Imad
• Format: Article
• Language: English
• Subjects: Electromagnetic compatibility; Gigahertz transverse electromagnetic mode; Integrated circuit electromagnetic model; Trans electromagnetic
• ISSN: 1879-2391; 1879-2391
• DOI: 10.1016/j.mejo.2003.11.001

The purpose of this paper is to present the results obtained with a gigahertz transverse electromagnetic mode (GTEM) cell for each phase of the project development, which consists of measuring and quantifying the integrated circuit's emissions and immunity compliance with automotive standards. These standards are defined using half anechoic chambers (HAC). Studies have already been conducted to compare trans electromagnetic (TEM) cell and HAC, or far-field emissions, and the test results show a limited correlation between TEM cells and the free space field or HAC. In this paper, it is shown that the correlation between the measurements made in a GTEM cell and HAC can be good enough in allowing us to use the GTEM facility during the research and development (R&D) phase (considering the facts that the HAC facility is often quite overloaded and of a high cost), that knowledge of the electromagnetic compatibility behavior of the integrated circuit is important for predicting the whole system's results as well as how to use an integrated circuit electromagnetic model to make the prediction of emissions.