Porous silicon optical cavity structure applied to high sensitivity organic solvent sensor

The present work reports the thermal annealing process, the number of layer and electrochemical process effect in the optical response quality of Bragg and microcavity devices that were applied as organic solvent sensors. These devices have been obtained by using porous silicon (PS) technology. The...

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Bibliographic Details
Published in:Microelectronics 2008-03, Vol.39 (3-4), p.499-506
Main Authors: Huanca, Danilo R., Ramirez-Fernandez, Francisco J., Salcedo, Walter J.
Format: Article
Language:English
Subjects:
Microcavities
Optical sensors
Photonic crystal
Porous silicon
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Summary:The present work reports the thermal annealing process, the number of layer and electrochemical process effect in the optical response quality of Bragg and microcavity devices that were applied as organic solvent sensors. These devices have been obtained by using porous silicon (PS) technology. The optical characterization of the Bragg reflector, before annealing, showed a broad photonic band-gap structure with blue shifted and narrowed after annealing process. The electrochemical process used to obtain the PS-based device imposes the limit in the number of layers because of the chemical dissolution effect. The interface roughness minimizations in the devices have been achieved by using the double electrochemical cell setup. The microcavity devices showed to have a good sensibility for organic solvent detection. The thermal annealed device showed better sensibility feature and this result was attributed to passivation of the surface devices.
ISSN:1879-2391
1879-2391
DOI:10.1016/j.mejo.2007.07.025