Fixed charges at the HfO 2 /SiO2 interface: Impact on the memory window of FeFET

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Bibliographic Details
Published in:Memories - Materials, Devices, Circuits and Systems Devices, Circuits and Systems, 2023-07, Vol.4, p.100050, Article 100050
Main Authors: Sk, Masud Rana, Pande, Shubham, Müller, Franz, Raffel, Yannick, Lederer, Maximilian, Pirro, Luca, Beyer, Sven, Seidel, Konrad, Kämpfe, Thomas, De, Sourav, Chakrabarti, Bhaswar
Format: Article
Language:English
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ISSN:2773-0646
2773-0646
DOI:10.1016/j.memori.2023.100050