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Dependability and testing of modern digital systems
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| Published in: | Microprocessors and microsystems 2008-08, Vol.32 (5), p.243-243 |
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| Main Author: | |
| Format: | Article |
| Language: | English |
| Online Access: | Get full text |
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| ISSN: | 0141-9331 1872-9436 |
| DOI: | 10.1016/j.micpro.2008.05.001 |