A new high-voltage H2S single noxious gas reliability test for power modules

The impact of H2S on the corrosion of Cu electrodes under applied bias is investigated for a test structure that simulates the conditions in a power module. Growth of Cu sulphide dendrites is identified as the predominant aging mechanism, and the influence of the main impact parameters such as humid...

Full description

Saved in:
Bibliographic Details
Published in:Microelectronics and reliability 2019-09, Vol.100-101, p.113468, Article 113468
Main Authors: Wassermann, T.N., Schilling, O., Müller, K., Rossin, A., Uhlig, J.
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The impact of H2S on the corrosion of Cu electrodes under applied bias is investigated for a test structure that simulates the conditions in a power module. Growth of Cu sulphide dendrites is identified as the predominant aging mechanism, and the influence of the main impact parameters such as humidity, concentration and voltage is modelled. The concept of reactivity monitoring of Cu coupons is applied to a proposed test condition, and the acceleration compared to a standardized operational condition is explained.
ISSN:0026-2714
1872-941X
DOI:10.1016/j.microrel.2019.113468