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Extended symbol correction algorithm for group testing based non-binary error correction codes of minimum distance d < 5
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Published in: | Microelectronics and reliability 2020-10, Vol.113, p.113724, Article 113724 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites |
Online Access: | Get full text |
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ISSN: | 0026-2714 |
DOI: | 10.1016/j.microrel.2020.113724 |