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Extended symbol correction algorithm for group testing based non-binary error correction codes of minimum distance d < 5

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Bibliographic Details
Published in:Microelectronics and reliability 2020-10, Vol.113, p.113724, Article 113724
Main Authors: Garcia-Herrero, F., Sánchez-Macián, A., Maestro, J.A., Flanagan, M.F.
Format: Article
Language:English
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ISSN:0026-2714
DOI:10.1016/j.microrel.2020.113724