Conducted EMI susceptibility analysis of a COTS processor as function of thermal cycling and overvoltage stresses

As technology evolves, processors are increasingly used in critical applications while the operating environment has become more unfavorable, with greater electromagnetic interference (EMI) detrimental to the proper functioning of the component. In this context, EMI represents one of the most critic...

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Bibliographic Details
Published in:Microelectronics and reliability 2021-11, Vol.126, p.114247, Article 114247
Main Authors: Soares, Matheus Fay, Vargas, Fabian Luis, D'Ornelas Benfica, Juliano
Format: Article
Language:English
Subjects:
Aging
Burn-in
Conducted EMI
Cortex-M4 processor
Electromagnetic susceptibility
Reliability analysis
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Summary:As technology evolves, processors are increasingly used in critical applications while the operating environment has become more unfavorable, with greater electromagnetic interference (EMI) detrimental to the proper functioning of the component. In this context, EMI represents one of the most critical problems for assessing the reliability and robustness of electronic systems, worsening when associated with the natural aging effect of circuits. This paper investigates the electromagnetic susceptibility (EMS) of a Cortex-M4 processor to conducted EMI in the power supply lines as function of accelerated aging. The component's reliability assessment was performed according to the IEC 61000-4-4 and IEC 61000-4-6 standards as function of the accelerated aging by means of stress combination of temperature variations and overvoltage. Test results demonstrated an increased processor susceptibility to conducted EMI after accelerated aging process. In this context, after aging it was observed a 13,166% increase in the number of observed faults, while current consumption raised by 5.63%.
ISSN:0026-2714
1872-941X
DOI:10.1016/j.microrel.2021.114247