Contact reliability design modeling for wire spring-hole electrical connectors

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Bibliographic Details
Published in:Microelectronics and reliability 2023-09, Vol.148, p.115182, Article 115182
Main Authors: Ping, Qian, Youwei, Wang, Wenhua, Chen, Zhe, Wang, Yujie, Wei
Format: Article
Language:English
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ISSN:0026-2714
DOI:10.1016/j.microrel.2023.115182