Young׳s modulus of individual ZnO nanowires

We used a contact-mode atomic force microscopy (AFM) to study the mechanical properties of an individual ZnO nanowire in the open air. It is noteworthy that the Young׳s modulus can be determined by an AFM tip compressing a single nanowire on a rigid substrate, which can bring more repeatability and...

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Bibliographic Details
Published in:Materials science & engineering. A, Structural materials : properties, microstructure and processing Structural materials : properties, microstructure and processing, 2014-07, Vol.610, p.1-4
Main Authors: Jiang, Dayong, Tian, Chunguang, Liu, Qingfei, Zhao, Man, Qin, Jieming, Hou, Jianhua, Gao, Shang, Liang, Qingcheng, Zhao, Jianxun
Format: Article
Language:English
Subjects:
AFM
Nanowires
Young׳s modulus
ZnO
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Summary:We used a contact-mode atomic force microscopy (AFM) to study the mechanical properties of an individual ZnO nanowire in the open air. It is noteworthy that the Young׳s modulus can be determined by an AFM tip compressing a single nanowire on a rigid substrate, which can bring more repeatability and accuracy for the measurements. In particular, the calculated radial Young׳s modulus of ZnO nanowires is consistent with the data of ZnO bulks and thin films. We also present the Young׳s modulus with different diameters, and all these are discussed deeply.
ISSN:0921-5093
1873-4936
DOI:10.1016/j.msea.2014.05.027