Electrical characterization of current conduction in Au/TiO2/n-Si at wide temperature range

Saved in:
Bibliographic Details
Published in:Materials science in semiconductor processing 2009-12, Vol.12 (6), p.224-232
Main Authors: ALTUNTAS, H, BENGI, A, AYDEMIR, U, ASAR, T, CETIN, S. S, KARS, I, ALTINDAL, S, OZCELIK, S
Format: Article
Language:English
Subjects:
Applied sciences
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Cross-disciplinary physics: materials science
rheology
Deposition by sputtering
Diodes
Electron and ion emission by liquids and solids
impact phenomena
Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures
Electronics
Exact sciences and technology
Materials science
Methods of deposition of films and coatings
film growth and epitaxy
Physics
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Surface double layers, schottky barriers, and work functions
Thermionic emission
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:
ISSN:1369-8001
1873-4081
DOI:10.1016/j.mssp.2009.12.001