The surface morphology, structural properties and chemical composition of Cd1−xZnxTe polycrystalline thick films deposited by close spaced vacuum sublimation

Thick polycrystalline Cd1−xZnxTe films with x ranged from 0.37 to 0.80 were obtained by the close spaced vacuum sublimation method. In order to investigate properties of the films structural, PIXE and Raman studies were carried out. Determination of chemical composition of the films by EDS, PIXE and...

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Bibliographic Details
Published in:Materials science in semiconductor processing 2017-06, Vol.63, p.64-71
Main Authors: Znamenshchykov, Y.V., Kosyak, V.V., Opanasyuk, A.S., Dauksta, E., Ponomarov, A.A., Romanenko, A.V., Stanislavov, A.S., Medvids, A., Shpetnyi, I.O., Gorobets, Yu.I.
Format: Article
Language:English
Subjects:
Crystal structure
Polycrystalline deposition
Semiconducting ternary compounds
Solid solutions
X-ray diffraction
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Summary:Thick polycrystalline Cd1−xZnxTe films with x ranged from 0.37 to 0.80 were obtained by the close spaced vacuum sublimation method. In order to investigate properties of the films structural, PIXE and Raman studies were carried out. Determination of chemical composition of the films by EDS, PIXE and XRD has shown good correlation of results. Raman spectroscopy reveals the relation between zinc concentration and vibrational properties of the films. Studies of the spatial distribution of the chemical elements on the film surface by micro-PIXE and micro-Raman spectroscopy have shown that films are uniform and free of secondary phases such as CdTe, ZnTe and Te inclusions.
ISSN:1369-8001
1873-4081
DOI:10.1016/j.mssp.2017.02.004