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Bipolar conductivity in amorphous Cu–Al–O thin films prepared by r.f. magnetron sputtering

Bipolar electronic behavior has been demonstrated in amorphous Cu–Al–O thin films prepared on soda-lime glass substrate via radio frequency (r.f.) magnetron sputtering deposition technique. The tunable majority charge carrier type is as a result of the intentional adjustment of the percentage chemic...

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Bibliographic Details
Published in:Materials science in semiconductor processing 2021-03, Vol.123, p.105557, Article 105557
Main Authors: Igbari, Femi O., Essien, Enobong R., Abdulwahab, Khadijat O., Nejo, Ayorinde O., Adetona, Ademola, Adams, Luqman A.
Format: Article
Language:English
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Summary:Bipolar electronic behavior has been demonstrated in amorphous Cu–Al–O thin films prepared on soda-lime glass substrate via radio frequency (r.f.) magnetron sputtering deposition technique. The tunable majority charge carrier type is as a result of the intentional adjustment of the percentage chemical composition of the material. Signs of Hall coefficients from Hall effect measurement and slopes of Mott-Schottky plots obtained for the films indicate the majority charge carrier type of each films. Negative Hall coefficient and a positive Mott-Schottky slope were obtained for the Al-rich film showing its n-type nature. Positive Hall coefficient and negative Mott-Schottky slope were obtained for the Cu-rich film showing its p-type nature. X-Ray Photoelectron Spectroscopy (XPS) was used to explain the variation in charge carrier type as a result of the adjustments made to the percentage chemical composition of the film. The I–V curves obtaine from simple devices fabricated show that the homojunction formed from the two films exhibit rectifying and photovoltaic properties. The rectifying behavior was studied between a bias of −1 V to +1 V. In addition, a VOC of 0.33 V, a JSC of 8.00 mA/cm2, an FF of 0.30 and a PCE of 0.79% were obtained from the photovoltaic device fabricated. Through XPS investigations, Hall effect measurements and Mott-Schottky plots, bipolar electrical conductivity and its origin was demonstrated in amorphous Cu–Al–O thin films prepared via r.f. magnetron sputtering deposition technique.• The established bipolar nature of the thin films was applied in the fabrication of pn homojunction devices in which they showed rectifying and photovoltaic properties.mBipolar conductivity in amorphous Cu–Al–O thin films prepared by r.f. magnetron sputtering. [Display omitted]
ISSN:1369-8001
1873-4081
DOI:10.1016/j.mssp.2020.105557