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High quality of N-polar GaN film fabricated by layer transfer technology using high selective material removal rate of CMP
A new method has been proposed for layer transfer technology to fabricate N-polar GaN film, which is extremely promising to be applied in the preparation of related devices. In our study, after wafer bonding and original Si substrate removal process, the N-polar GaN was exposed by chemical mechanica...
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Published in: | Materials science in semiconductor processing 2022-04, Vol.141, p.106440, Article 106440 |
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Main Authors: | , , , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | A new method has been proposed for layer transfer technology to fabricate N-polar GaN film, which is extremely promising to be applied in the preparation of related devices. In our study, after wafer bonding and original Si substrate removal process, the N-polar GaN was exposed by chemical mechanical polishing (CMP) within a short time due to the high selective material removal rate (MRR) ratio of about 35:1 between N-polar AlxGa1-xN (0.33≤x≤1, 1400 nm/min) and N-polar GaN (40 nm/min). The high selective MRR can be attributed to the different corrosion resistance. Hexagonal hillock structure and corrosion pits were appeared quickly on the AlN surface when immersing the N-polar AlN and N-polar GaN in the same CMP slurry, but was not observed on the GaN surface. Meanwhile, the quality of the fabricated N-polar GaN film has been characterized by atomic force microscope (AFM) and Photoluminescence (PL) spectroscopy. Comparing with the N-polar GaN processed through inductive coupled plasma (ICP) etching, the N-polar GaN fabricated by CMP has smaller surface roughness (Rq=0.307 nm) and stronger band-edge PL intensity indicating fewer surface damage. These results can provide guidance on the fabrication of N-polar GaN related devices.
•A new method for layer transfer technology to fabricate N-polar GaN.•High selective material removal rate of CMP between N-polar Al1-xGaxN and GaN.•Damage-free N-polar GaN film with smooth surface was first fabricated efficiently. |
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ISSN: | 1369-8001 1873-4081 |
DOI: | 10.1016/j.mssp.2021.106440 |