Radiation tests of CMS RPC muon trigger electronic components

The results of proton irradiation test of electronic devices, selected for the RPC trigger electronic system of the CMS detector, will be presented. For Xilinx Spartan-IIE FPGA the cross-section for Single Event Upsets (SEUs) in configuration bits was measured. The dynamic SEUs in flip-flops were al...

Full description

Saved in:
Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Accelerators, spectrometers, detectors and associated equipment, 2005-02, Vol.538 (1), p.708-717
Main Authors: Buńkowski, Karol, Kassamakov, Ivan, Królikowski, Jan, Kierzkowski, Krzysztof, Kudła, Maciej, Maenpaa, Teppo, Poźniak, Krzysztof, Rybka, Dominik, Tuominen, Eija, Ungaro, Donatella, Wrochna, Grzegorz, Zabołotny, Wojciech
Format: Article
Language:English
Subjects:
FLASH
FPGA
Radiation
SDRAM
SEU
SRAM
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The results of proton irradiation test of electronic devices, selected for the RPC trigger electronic system of the CMS detector, will be presented. For Xilinx Spartan-IIE FPGA the cross-section for Single Event Upsets (SEUs) in configuration bits was measured. The dynamic SEUs in flip-flops were also investigated, but not observed. For the FLASH memories no single upsets were detected. Only after irradiating with a huge dose permanent damages of devices were observed. For Synchronous Dynamic Random Access Memory (SDRAM), the SEU cross-section was measured.
ISSN:0168-9002
1872-9576
DOI:10.1016/j.nima.2004.08.113