Soft X-ray spectromicroscopy beamline at the CLS: Commissioning results

The soft X-ray spectromicroscopy beamline (SM) at the Canadian Light Source (CLS) is a dedicated spectromicroscopy facility, consisting of an elliptically polarized undulator (EPU), a beamline based on a collimated PGM optimized for 100–2000 eV range and two end stations: scanning transmission X-ray...

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Accelerators, spectrometers, detectors and associated equipment, 2007-11, Vol.582 (1), p.96-99
Main Authors: Kaznatcheev, K.V., Karunakaran, Ch, Lanke, U.D., Urquhart, S.G., Obst, M., Hitchcock, A.P.
Format: Article
Language:English
Subjects:
EPU
PEEM
PGM
Soft X-ray beam line
Spectromicroscopy
STXM
Synchrotron radiation
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Summary:The soft X-ray spectromicroscopy beamline (SM) at the Canadian Light Source (CLS) is a dedicated spectromicroscopy facility, consisting of an elliptically polarized undulator (EPU), a beamline based on a collimated PGM optimized for 100–2000 eV range and two end stations: scanning transmission X-ray microscope (STXM) and roll-in X-ray photoemission electron microscope (X-PEEM, from Elmitec GmbH). The overall system has achieved its design parameters with an on-sample flux of ∼10 8 ph/s@ R=3000, 0.5 A in STXM and ∼10 12 ph/s@ R=3000, 0.5 A in the PEEM, in each case at a spatial resolution exceeding 40 nm. It can also provide an energy resolving power above 10,000. A careful EPU calibration procedure enables advanced polarization measurements.
ISSN:0168-9002
1872-9576
DOI:10.1016/j.nima.2007.08.083