Slow-neutron-induced charged-particle emission-channeling-measurements with Medipix detectors

The lattice location of helium, lithium, beryllium, boron or sodium host or impurity atoms in single crystals can be studied by slow-neutron-induced charged particle emission channeling measurements. Modern silicon pixel detectors can cover an entire emission channeling pattern in a single measureme...

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Accelerators, spectrometers, detectors and associated equipment, 2011-05, Vol.633, p.S267-S269
Main Authors: Köster, Ulli, Granja, Carlos, Jakůbek, Jan, Uher, Josef, Vacik, Jiri
Format: Article
Language:English
Subjects:
(n,p) reaction, (n,alpha) reaction
Emission channeling
Lattice location
Silicon pixel detector
Thermal neutron-induced reactions
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Summary:The lattice location of helium, lithium, beryllium, boron or sodium host or impurity atoms in single crystals can be studied by slow-neutron-induced charged particle emission channeling measurements. Modern silicon pixel detectors can cover an entire emission channeling pattern in a single measurement and allow reviving this technique for practical applications. We report on the use of the TimePix detector for such emission channeling experiments with samples containing 6Li, 7Be or 10B.
ISSN:0168-9002
1872-9576
DOI:10.1016/j.nima.2010.06.184