Charge-trap correction and radiation damage in orthogonal-strip planar germanium detectors

A charge-carrier trap correction technique was developed for orthogonal strip planar germanium gamma-ray detectors. The trap corrector significantly improves the gamma-ray energy resolution of detectors with charge-carrier trapping from crystal-growth defects and radiation damage. Two orthogonal-str...

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Accelerators, spectrometers, detectors and associated equipment, 2014-10, Vol.762, p.125-129
Main Authors: Hull, E.L., Jackson, E.G., Lister, C.J., Pehl, R.H.
Format: Article
Language:English
Subjects:
Charge-carrier trapping
Germanium detector
HPGe
Radiation damage
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Summary:A charge-carrier trap correction technique was developed for orthogonal strip planar germanium gamma-ray detectors. The trap corrector significantly improves the gamma-ray energy resolution of detectors with charge-carrier trapping from crystal-growth defects and radiation damage. Two orthogonal-strip planar germanium detectors were radiation damaged with 2-MeV neutron fluences of ~8×109n/cm2. The radiation-damaged detectors were studied in the 60–80K temperature range.
ISSN:0168-9002
1872-9576
DOI:10.1016/j.nima.2014.05.086