A concept for spatially and time correlated single event effect detection in semiconductors using Timepix type pixel detectors

Single Event Effects (SEE), caused generally by single energetic particles, pose an important issue when implementing electronics in a harsh radiation environment. In this work, we present an electronic system for measuring SEEs temporally and spatially correlated with Timepix3 detectors. The Timepi...

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Accelerators, spectrometers, detectors and associated equipment, 2020-11, Vol.980, p.164397, Article 164397
Main Authors: Broulim, J., Broulim, P., Campbell, M., Georgiev, V., Holik, M., Kunstmuller, P., Pavlicek, V., Pospisil, S., Vavroch, O., Vlasek, J., Zich, J.
Format: Article
Language:English
Subjects:
Device under test
Single event effects
Timepix
uProbe
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Summary:Single Event Effects (SEE), caused generally by single energetic particles, pose an important issue when implementing electronics in a harsh radiation environment. In this work, we present an electronic system for measuring SEEs temporally and spatially correlated with Timepix3 detectors. The Timepix detector is a semiconductor pixel detector, which contains 256 x 256 pixels. It provides energy or time information for each hit pixel. Our experimental setup consists of FPGA based board synchronized Timepix readout and a Device Under Test (DUT). •New concept for SEE detection.•The last generation of Timepix detector used in the telescope setup.•First tests of this concept.•New plugins for the existing software.
ISSN:0168-9002
1872-9576
DOI:10.1016/j.nima.2020.164397