Single event effect in ABC ASICs for ITk strip upgrade

• Published in: Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Accelerators, spectrometers, detectors and associated equipment, 2024-08, Vol.1065, p.169531, Article 169531
• Main Authors: Peng, Shaogang, Basso, Matthew, Chen, Xin, Dandoy, Jeff, Gallop, Bruce, John, Jaya John, Jing, Hantao, Keener, Paul, Leitao, Pedro, Lu, Weiguo, Liu, Peilian, Li, Qiang, Liu, Yang, Li, Hui, Mayers, Godwin, Newcomer, Mitchell, Phillips, Peter, Shi, Xin, Tan, Zhixin, Warren, Matt, Wang, Chengwei, Xia, Mingming, Zhou, Yan
• Format: Article
• Language: English
• Subjects: ABC; ASICs; CSNS; HL-LHC; Proton beam; SEE; TMR
• ISSN: 0168-9002; 1872-9576
• DOI: 10.1016/j.nima.2024.169531

This is the first study of the ABCStar V1 chips with an 80 MeV proton beam from CSNS. The ITk strip upgrade project utilizes the custom ABCStar ASIC, employing Triple Modular Redundancy technology to enhance its resistance to Single Event Effects caused by radiation. We tested the effectiveness of the radiation protections by operating the ASICs within a proton beam. This paper introduces the analysis of logic upsets for the production version of the ABCStar ASIC with a single-chip test system at the proton beam platform of the CSNS. The study of logic upsets in pipeline and registers was carried out at 80 MeV. Bit flips in the ABCStar V1 with Triple Modular Redundancy protections are reduced significantly as expected. We have also observed that proton beam at this energy level may have an impact on the chip itself, potentially changing the operating mode of chips, which was not observed previously. •We tested ABC ASICs at CSNS APEP with proton irradiation, measuring SEU cross sections.•This is the first study of radiation effects on single chips at this major scientific facility.•CSNS data shows O(200) hit errors/sec in the Inner Tracker, 7 orders lower than expected electronic noise.