Threshold concentration for ion implantation-induced Co nanocluster formation in TiO 2 :Co thin films

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Beam interactions with materials and atoms, 2016-12, Vol.389-390, p.13-16
Main Authors: Yıldırım, O., Cornelius, S., Smekhova, A., Butterling, M., Anwand, W., Wagner, A., Bähtz, C., Böttger, R., Potzger, K.
Format: Article
Language:English
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ISSN:0168-583X
DOI:10.1016/j.nimb.2016.11.009