Study on the application of SiPM to γ ray and charged particle measurement using scintillation crystals

The characteristics of a Silicon Photo Multiplier (SiPM)-based scintillation detector system were studied. The influence of the bias voltage and the number of SiPMs on the energy resolution was identified. The single SiPM energy spectra in the multi-SiPM system showed their dependency on the positio...

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Beam interactions with materials and atoms, 2023-08, Vol.541, p.45-47
Main Authors: Bae, S., Hwang, J.W., Ahn, S., Cha, S.M., Hahn, K.I., Kim, D., Kim, Y.H., Park, C., López, X. Pereira, Kim, C.
Format: Article
Language:English
Subjects:
CsI(Tl)
GAGG:Ce
Plastic scintillator
Scintillation detector
SiPM
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Summary:The characteristics of a Silicon Photo Multiplier (SiPM)-based scintillation detector system were studied. The influence of the bias voltage and the number of SiPMs on the energy resolution was identified. The single SiPM energy spectra in the multi-SiPM system showed their dependency on the position of the 60Co radiation source. The application of geometric mean on the multi-SiPM system was also considered to bypass single channel calibrations. Preliminary results on the performances of developing scintillation detectors with a CsI(Tl) crystal or a plastic scintillator are demonstrated. The capability of charged particle measurement for CsI(Tl) crystal and sub-nanosecond timing resolution of plastic scintillator were identified.
ISSN:0168-583X
1872-9584
DOI:10.1016/j.nimb.2023.04.052