The effect of X-ray exposure on Ba 2 SiO 4 : Eu 3

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Bibliographic Details
Published in:Optics communications 2018-03, Vol.410, p.617-622
Main Authors: Volhard, Max-Fabian, Jüstel, Thomas
Format: Article
Language:English
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ISSN:0030-4018
DOI:10.1016/j.optcom.2017.10.050