Titanium distribution profiles obtained by luminescence and LIBS measurements on Ti: Al 2 O 3 grown by Czochralski and Kyropoulos techniques

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Bibliographic Details
Published in:Optical materials 2017-03, Vol.65, p.28-32
Main Authors: Alombert-Goget, Guillaume, Trichard, Florian, Li, Hui, Pezzani, Cyril, Silvestre, Maud, Barthalay, Nicolas, Motto-Ros, Vincent, Lebbou, Kheirreddine
Format: Article
Language:eng ; jpn
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ISSN:0925-3467
DOI:10.1016/j.optmat.2016.09.049