An alternative method to determine the refractive index of AlxGa1−xN

Certain characterizations of AlxGa1−xN epilayers require knowledge of the refractive index. Four theoretical models are reviewed, and a simple method to obtain the refractive index n of AlxGa1−xN is proposed. Values of the refractive index obtained at various wavelengths and Al concentrations are co...

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Bibliographic Details
Published in:Physica. B, Condensed matter Condensed matter, 2016-01, Vol.480, p.181-185
Main Authors: Engelbrecht, J.A.A., Sephton, B., Minnaar, E., Wagener, M.C.
Format: Article
Language:English
Subjects:
AlGaN
Refractive index determination
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Summary:Certain characterizations of AlxGa1−xN epilayers require knowledge of the refractive index. Four theoretical models are reviewed, and a simple method to obtain the refractive index n of AlxGa1−xN is proposed. Values of the refractive index obtained at various wavelengths and Al concentrations are compared to the theoretical models, as well as to previously obtained experimental results. Acceptable agreement with both theoretical and experimental values are obtained.
ISSN:0921-4526
1873-2135
DOI:10.1016/j.physb.2015.08.047