High-resolution X-ray diffraction analysis of SnTe/Sn1−xEuxTe superlattices grown on (111) BaF2 substrates

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Bibliographic Details
Published in:Physica. E, Low-dimensional systems & nanostructures Low-dimensional systems & nanostructures, 2004-01, Vol.20 (3-4), p.462-465
Main Authors: Abramof, E., Rappl, P.H.O., Ueta, A.Y.
Format: Article
Language:English
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ISSN:1386-9477
DOI:10.1016/j.physe.2003.08.058