Reprint of : Measuring the Luttinger liquid parameter with shot noise

• Published in: Physica. E, Low-dimensional systems & nanostructures Low-dimensional systems & nanostructures, 2016-08, Vol.82, p.293-300
• Main Authors: Kühne, J.K., Protopopov, I.V., Oreg, Y., Mirlin, A.D.
• Format: Article
• Language: English
• Subjects: Luttinger liquid; Quantum Hall edges; Shot noise
• ISSN: 1386-9477; 1873-1759
• DOI: 10.1016/j.physe.2016.02.043

We explore the low-frequency noise of interacting electrons in a one-dimensional structure (quantum wire or interaction-coupled edge states) with counterpropagating modes, assuming a single channel in each direction. The system is driven out of equilibrium by a quantum point contact (QPC) with an applied voltage, which induces a double-step energy distribution of incoming electrons on one side of the device. A second QPC serves to explore the statistics of outgoing electrons. We show that measurement of a low-frequency noise in such a setup allows one to extract the Luttinger liquid constant K which is the key parameter characterizing an interacting 1D system. We evaluate the dependence of the zero-frequency noise on K and on parameters of both QPCs (transparencies and voltages). •We explore the low-frequency noise of interacting electrons in one dimension.•The system is driven out of equilibrium by a QPC with an applied voltage.•A second QPC serves to explore the statistics of outgoing electrons.•Low-frequency noise in such a setup allows to measure the Luttinger liquid constant.