Depth-resolved characterization of cryogenic hard turned surface layer of AISI 52100 by X-ray diffraction and scanning electron microscopy investigations

In this study, the cryogenic hard turned surface layer of AISI 52100 steel was characterized by depth-resolved investigations of the residual stresses and the austenitic phase content from the surface to a depth of 100 µm. The specimens were manufactured with machining parameters that were chosen ba...

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Bibliographic Details
Published in:Procedia CIRP 2022, Vol.108, p.66-71
Main Authors: Ankener, Werner, Smaga, Marek, Uebel, Julian, Seewig, Jörg, Grossmann, Felix, Basten, Stephan, Kirsch, Benjamin, Aurich, Jan C., Beck, Tilmann
Format: Article
Language:English
Subjects:
AISI 52100
Cryogenic hard turning
GIXRD
Residual stress
Retained austenite
Surface integrity
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Summary:In this study, the cryogenic hard turned surface layer of AISI 52100 steel was characterized by depth-resolved investigations of the residual stresses and the austenitic phase content from the surface to a depth of 100 µm. The specimens were manufactured with machining parameters that were chosen based on an empiric model of cryogenic turning. Significant differences were quantified between the specimens regarding residual stresses and the austenitic phase content down to a depth of 20 µm. Here, Grazing Incidence XRD and FIB technique were applied to analyze the mechanically and thermally induced white layer regarding their austenitic phase content and microstructure.
ISSN:2212-8271
2212-8271
DOI:10.1016/j.procir.2022.03.015