Intelligent System for Active Dielectrics Parameters Research

• Published in: Procedia computer science 2018, Vol.132, p.1163-1170
• Main Authors: Pecherskaya, E.A., Golubkov, P.E., Fimin, A.V., Zinchenko, T.O., Pechersky, A.V., Shepeleva, J.V.
• Format: Article
• Language: English
• Subjects: Active dielectric; intelligent system; measurement error; measurement method; measurement of dielectric parameters
• ISSN: 1877-0509; 1877-0509
• DOI: 10.1016/j.procs.2018.05.031

The structure of the intellectual system and methods of automated measurements of active dielectric parameters are proposed. The intelligent system automates the process of measuring the dielectric parameters of materials depending on the temperature and electric field strength; decides on the choice of measurement methods; processes the measurement results and calculates the porosity of the measurement results. The original methods of measuring the capacitance and the active component of the resistance of a ferroelectric capacitor characterizing its dielectric losses are developed. Both methods are based on the modification of the Sawyer-Tower scheme proposed by the authors. The intelligent system implements methods for measuring the temperature dependences of the dielectric parameters of the active dielectrics. The algorithms, based for the methods, are founded on the measurement of the inverse dielectric susceptibility depending on temperature and are different for ferroelectrics with the phase transition of the first and second kind. These methods allowed to increase the measurements efficiency 3 times by reducing the number of measurement procedures, performing measurements in a narrow temperature range and modeling dielectric parameters in the desired temperature range.