Optimization of testing for complex digital devices

As the integration level increases, development of efficient test techniques becomes more challenging as well. The article describes basic principles of combining individual tests of the modules that make up the digital device into a single test program. Combination of tests is carried out with inco...

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Bibliographic Details
Published in:Procedia computer science 2021, Vol.190, p.82-89
Main Authors: Berezkin, Evgeny F., Krasnikova, Svetlana A., Shuvalov, Victor B.
Format: Article
Language:English
Subjects:
Control test
diagnostic test
test program
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Summary:As the integration level increases, development of efficient test techniques becomes more challenging as well. The article describes basic principles of combining individual tests of the modules that make up the digital device into a single test program. Combination of tests is carried out with incomplete information regarding the reactions of a faulty digital device. Characteristic sets are introduced in order to evaluate individual test checks of modules. The properties of an optimally ordered sequence of tests in a test program are formulated. Heuristic algorithms for ordering tests are proposed.
ISSN:1877-0509
1877-0509
DOI:10.1016/j.procs.2021.06.010