Forensic application of total reflection X-ray fluorescence spectrometry for elemental characterization of ink samples

• Published in: Spectrochimica acta. Part B: Atomic spectroscopy 2010-02, Vol.65 (2), p.167-170
• Main Authors: Dhara, Sangita, Misra, N.L., Maind, S.D., Kumar, Sanjukta A., Chattopadhyay, N., Aggarwal, S.K.
• Format: Article
• Language: English
• Subjects: Forensic; ICP-MS; Ink; Rare earths; TXRF
• ISSN: 0584-8547; 1873-3565
• DOI: 10.1016/j.sab.2010.01.004

The possibility of applying Total Reflection X-ray Fluorescence for qualitative and quantitative differentiation of documents printed with rare earth tagged and untagged inks has been explored in this paper. For qualitative differentiation, a very small amount of ink was loosened from the printed documents by smoothly rubbing with a new clean blade without destroying the manuscript. 50 μL of Milli-Q water was put on this loose powder, on the manuscript, and was agitated by sucking and releasing the suspension two to three times with the help of a micropipette. The resultant dispersion was deposited on quartz sample support for Total Reflection X-ray Fluorescence measurements. The Total Reflection X-ray Fluorescence spectrum of tagged and untagged inks could be clearly differentiated. In order to see the applicability of Total Reflection X-ray Fluorescence for quantitative determinations of rare earths and also to countercheck such determinations in ink samples, the amounts of rare earth in painted papers with single rare earth tagged inks were determined by digesting the painted paper in HNO 3/HClO 4, mixing this solution with the internal standard and recording their Total Reflection X-ray Fluorescence spectra after calibration of the instrument. The results thus obtained were compared with those obtained by Inductively Coupled Plasma Mass Spectrometry and were found in good agreement. The average precision of the Total Reflection X-ray Fluorescence determinations was 5.5% (1 σ) and the average deviation of Total Reflection X-ray Fluorescence determined values with that of Inductively Coupled Plasma Mass Spectrometry was 7.3%. These studies have shown that Total Reflection X-ray Fluorescence offers a promising and potential application in forensic work of this nature.