Response to comment on: Size effects on yield strength and strain hardening for ultra-thin Cu films with and without passivation: A study by synchrotron and bulge test techniques

In their comment (M. Lagos et al., Scripta Mater. (2012), http://dx.doi.org/10.1016/j.scriptamat.2012.04.018), Lagos et al. propose a two-dimensional plasticity model based on grain boundary sliding to explain the deformation behavior of ultrathin Cu and Ta/Cu film systems on polyimide substrates. H...

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Bibliographic Details
Published in:Scripta materialia 2012-10, Vol.67 (7-8), p.740-742
Main Authors: Gruber, Patric A., Wanner, Alexander, Spolenak, Ralph, Arzt, Eduard
Format: Article
Language:English
Subjects:
Plasticity
Size effect
Strain hardening
Yield strength
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Summary:In their comment (M. Lagos et al., Scripta Mater. (2012), http://dx.doi.org/10.1016/j.scriptamat.2012.04.018), Lagos et al. propose a two-dimensional plasticity model based on grain boundary sliding to explain the deformation behavior of ultrathin Cu and Ta/Cu film systems on polyimide substrates. Here, we critically discuss their comments and include new results obtained by peak profile analysis of the original in situ diffraction data; they strongly suggest that the deformation behavior of the different film systems is very likely not self-similar as claimed by Lagos et al.
ISSN:1359-6462
1872-8456
DOI:10.1016/j.scriptamat.2012.07.005