Phase transitions in Pb0.96La0.04(Zr0.95Ti0.05)O3 capacitors by in-situ AC-HRTEM

Antiferroelectrics (AFEs) undergo reversible antiferroelectric-ferroelectric (AFE-FE) phase transitions under external electric fields, and show great promise in modern electronic devices. The real-time phase transition behavior of pure PZO has been detected, while the dynamic studies of complex inc...

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Bibliographic Details
Published in:Scripta materialia 2024-12, Vol.253, p.116309, Article 116309
Main Authors: Er, Xiaokuo, Chen, Peng, Zhan, Qian
Format: Article
Language:English
Subjects:
Antiferroelectrics
In-situ AC-HRTEM
Incommensurately modulated structure
Phase transition
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Summary:Antiferroelectrics (AFEs) undergo reversible antiferroelectric-ferroelectric (AFE-FE) phase transitions under external electric fields, and show great promise in modern electronic devices. The real-time phase transition behavior of pure PZO has been detected, while the dynamic studies of complex incommensurately modulated structure have never been addressed. Here, with the strong support of in-situ aberration corrected high resolution transmission electron microscopy (AC-HRTEM), the structural evolutionary behaviors in Pb0.96La0.04(Zr0.95Ti0.05)O3 (PLZT) film excited by energetic electron beams is decoded. The AFE-to-FE phase transition occurs via a 90° reorientation and a rapid expansion of domain boundary region at the expense of the initial AFE matrix. At the same time, the modulation periods experience a monotonic increase in the reorientation region. The observation is of certain significance to establish the deep-seated phase transition mechanism, which will facilitate the development of antiferroelectric-based nanoelectronics. [Display omitted]
ISSN:1359-6462
DOI:10.1016/j.scriptamat.2024.116309