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Improving the FOM of photodetectors fabricated by Sn-doped CuS nanostructures

The Sn-doped CuS nanostructures with different Sn-doping concentrations (Sn1 (5 %), Sn2 (10 %), and Sn3 (15 %)) were synthesized by the sonochemical method. Due to the difference in ionic radii between Cu and Sn, the stress in the CuS crystal was increased from 41 × 10−4 for the undoped sample to 50...

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Published in:Solid state sciences 2024-10, Vol.156, p.107653, Article 107653
Main Authors: Kavosh, Mehrdad, Jamali-Sheini, Farid, Cheraghizade, Mohsen, Yousefi, Ramin
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description The Sn-doped CuS nanostructures with different Sn-doping concentrations (Sn1 (5 %), Sn2 (10 %), and Sn3 (15 %)) were synthesized by the sonochemical method. Due to the difference in ionic radii between Cu and Sn, the stress in the CuS crystal was increased from 41 × 10−4 for the undoped sample to 50 × 10−4 for the Sn2-doped sample. The absorption of visible light by the doped samples was increased dramatically. The morphology of CuS nanostructures was changed from nanoparticles (NPs) in the undoped CuS to nanoplates in the Sn2-doped CuS. Finally, the optoelectronic applications of the samples were studied, and it was shown that all the samples responded to the visible light source, and their resistance was decreased due to light radiation. The results indicated that specific detectivity (D*), responsivity (R), and sensitivity (S) as the figure-of-merit (FOM) of the photodetectors were increased from 2.07 × 109 Jones, 0.92 mA W⁻1, and 1328 % for undoped CuS nanostructures to 65.22 × 109 Jones, 28.27 mA W⁻1, and 3802 % for the Sn2-doped CuS nanostructures. The Mott-Schottky (M − S) results indicated that a higher acceptor carrier concentration in the Sn-doped CuS compared to undoped CuS was one of the most critical factors in enhancing the FOM of the photodetectors fabricated with Sn-doped CuS nanostructures. [Display omitted] •Sn-Doped CuS nanostructures have been synthesized by the sonochemical method.•Figure-of-merit of the photodetectors based CuS nanostructures has been improved by Sn-doping.•Defect concentrations in the CuS nanostructures have been increased by Sn-doping.
doi_str_mv 10.1016/j.solidstatesciences.2024.107653
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Due to the difference in ionic radii between Cu and Sn, the stress in the CuS crystal was increased from 41 × 10−4 for the undoped sample to 50 × 10−4 for the Sn2-doped sample. The absorption of visible light by the doped samples was increased dramatically. The morphology of CuS nanostructures was changed from nanoparticles (NPs) in the undoped CuS to nanoplates in the Sn2-doped CuS. Finally, the optoelectronic applications of the samples were studied, and it was shown that all the samples responded to the visible light source, and their resistance was decreased due to light radiation. The results indicated that specific detectivity (D*), responsivity (R), and sensitivity (S) as the figure-of-merit (FOM) of the photodetectors were increased from 2.07 × 109 Jones, 0.92 mA W⁻1, and 1328 % for undoped CuS nanostructures to 65.22 × 109 Jones, 28.27 mA W⁻1, and 3802 % for the Sn2-doped CuS nanostructures. The Mott-Schottky (M − S) results indicated that a higher acceptor carrier concentration in the Sn-doped CuS compared to undoped CuS was one of the most critical factors in enhancing the FOM of the photodetectors fabricated with Sn-doped CuS nanostructures. 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Due to the difference in ionic radii between Cu and Sn, the stress in the CuS crystal was increased from 41 × 10−4 for the undoped sample to 50 × 10−4 for the Sn2-doped sample. The absorption of visible light by the doped samples was increased dramatically. The morphology of CuS nanostructures was changed from nanoparticles (NPs) in the undoped CuS to nanoplates in the Sn2-doped CuS. Finally, the optoelectronic applications of the samples were studied, and it was shown that all the samples responded to the visible light source, and their resistance was decreased due to light radiation. The results indicated that specific detectivity (D*), responsivity (R), and sensitivity (S) as the figure-of-merit (FOM) of the photodetectors were increased from 2.07 × 109 Jones, 0.92 mA W⁻1, and 1328 % for undoped CuS nanostructures to 65.22 × 109 Jones, 28.27 mA W⁻1, and 3802 % for the Sn2-doped CuS nanostructures. The Mott-Schottky (M − S) results indicated that a higher acceptor carrier concentration in the Sn-doped CuS compared to undoped CuS was one of the most critical factors in enhancing the FOM of the photodetectors fabricated with Sn-doped CuS nanostructures. [Display omitted] •Sn-Doped CuS nanostructures have been synthesized by the sonochemical method.•Figure-of-merit of the photodetectors based CuS nanostructures has been improved by Sn-doping.•Defect concentrations in the CuS nanostructures have been increased by Sn-doping.</abstract><pub>Elsevier Masson SAS</pub><doi>10.1016/j.solidstatesciences.2024.107653</doi><orcidid>https://orcid.org/0000-0002-1206-8673</orcidid></addata></record>
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subjects CuS nanostructures
Figure-of-merit
Optoelectronic devices
Sn-doping
Sonochemical method
title Improving the FOM of photodetectors fabricated by Sn-doped CuS nanostructures
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