Measurement of poly-Si film thickness on textured surfaces by X-ray diffraction in poly-Si/SiO passivating contacts for monocrystalline Si solar cells

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Bibliographic Details
Published in:Solar energy materials and solar cells 2022-03, Vol.236, p.111510, Article 111510
Main Authors: Chen, Kejun, Bothwell, Alexandra, Guthrey, Harvey, Hartenstein, Matthew B., Polzin, Jana-Isabelle, Feldmann, Frank, Nemeth, William, Theingi, San, Page, Matthew, Young, David L., Stradins, Paul, Agarwal, Sumit
Format: Article
Language:English
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ISSN:0927-0248
DOI:10.1016/j.solmat.2021.111510