Influence of substrate temperature on structural and optical properties of bismuth oxide thin films deposited by close-spaced vacuum sublimation

Bi2O3 thin films were deposited on ultrasonically-cleaned glass and mica substrates by close-spaced vacuum sublimation technique. Films surface morphology was studied using scanning electron microscopy (SEM). Structural study based on the transmission-electron microscopy (TEM) and selected-area elec...

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Bibliographic Details
Published in:Superlattices and microstructures 2015-12, Vol.88, p.600-608
Main Authors: Ivashchenko, M.M., Buryk, I.P., Latyshev, V.M., Stepanenko, A.O., Levchenko, K.S.
Format: Article
Language:English
Subjects:
Bi2O3
FTIR
Optical study
SEM
Tauc plot
TEM
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Summary:Bi2O3 thin films were deposited on ultrasonically-cleaned glass and mica substrates by close-spaced vacuum sublimation technique. Films surface morphology was studied using scanning electron microscopy (SEM). Structural study based on the transmission-electron microscopy (TEM) and selected-area electron diffraction (SAED) analysis has been shown that deposited films were polycrystalline with face-centered cubic structure. Optical study was carried out by spectral photometry analysis in the wavelengths range λ = 320–900 nm using the optical transmittance and absorbance measurements. For determination optical band gap Eg the Tauc plot was used and the band gap energy Eg is determined in the range of 3.50–3.62 eV, respectively. Fourier-transform infra-red (FTIR) analysis shown that obtained films are well-crystalline and have a good optical quality. •Bi2O3 thin films were deposited by a CSVS technique.•Film growth mechanism was evaluated through SEM and TEM analysis.•Spectroscopy and FTIR analysis confirmed films structural and optical quality.
ISSN:0749-6036
1096-3677
DOI:10.1016/j.spmi.2015.10.025