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Comparison of raised source/drain versus raised extension in ultra-thin body, fully-depleted-SOI, including effects of BEOL via capacitances
Raised source/drain (S/D) or raised extension in fully-depleted-SOI (FDSOI) is necessary to boost saturation current, because of increased resistance from the very thin film. We demonstrate that the choice of raising the extension versus the S/D, will depend upon the maximum achievable mobility in t...
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Published in: | Solid-state electronics 2004-09, Vol.48 (9), p.1607-1612 |
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Main Authors: | , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Raised source/drain (S/D) or raised extension in fully-depleted-SOI (FDSOI) is necessary to boost saturation current, because of increased resistance from the very thin film. We demonstrate that the choice of raising the extension versus the S/D, will depend upon the maximum achievable mobility in the structure at a 60 nm physical gate length. We also study the effects of minimum BEOL via spacing on performance, and its consequence on choosing a raised extension or S/D. |
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ISSN: | 0038-1101 1879-2405 |
DOI: | 10.1016/j.sse.2004.03.009 |