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Photodiode with low dark current built in silicon-on-insulator using electrostatic doping
In this paper, we demonstrate experimentally a novel SOI-based photodiode using electrostatic doping and fabricated in a simple, low-cost process. Unlike a conventional ion-implanted pn junction diode, the electrostatically doped devices feature extremely low reverse-bias current. When used for phot...
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Published in: | Solid-state electronics 2020-06, Vol.168, p.107733, Article 107733 |
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Main Authors: | , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | In this paper, we demonstrate experimentally a novel SOI-based photodiode using electrostatic doping and fabricated in a simple, low-cost process. Unlike a conventional ion-implanted pn junction diode, the electrostatically doped devices feature extremely low reverse-bias current. When used for photodetection, our devices exhibit a dark current three decades lower than a conventional photodiode and provide excellent detectivity even under low optical power density. Our electrostatically-doped diodes also feature enhanced response in the near-UV and 1/f low-frequency noise. |
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ISSN: | 0038-1101 1879-2405 |
DOI: | 10.1016/j.sse.2019.107733 |