Aperiodic W/B4C multilayer systems for X-ray optics: Quantitative determination of layer thickness by HAADF-STEM and X-ray reflectivity

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Bibliographic Details
Published in:Surface & coatings technology 2010-03, Vol.204 (12-13), p.1929-1932
Main Authors: HÄUSSLER, D, MORAWE, Ch, ROSS, U, ÖGÜT, B, SPIECKER, E, JÄGER, W, HERTLEIN, F, HEIDORN, U, WIESMANN, J
Format: Article
Language:English
Subjects:
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Materials science
Physics
Surface treatments
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ISSN:0257-8972
1879-3347
DOI:10.1016/j.surfcoat.2009.10.005