Thulium induced reconstructions of the Si(001) surface

The initial stages of epitaxial growth of Tm on Si(001) are studied by using scanning tunneling microscopy. Tm induces two kinds of surface reconstructions: 2×4 and a striped pseudo 2×7 phase. The morphology of the 2×4 is similar to the 2×4 phase induced by other rare earth metals. The pseudo 2×7 ph...

Full description

Saved in:
Bibliographic Details
Published in:Surface science 2011-12, Vol.605 (23-24), p.2038-2044
Main Authors: Cui, Y., Nogami, J.
Format: Article
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Lanthanides
Physics
Scanning tunneling microscopy
Silicides
Silicon
Surface reconstruction
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The initial stages of epitaxial growth of Tm on Si(001) are studied by using scanning tunneling microscopy. Tm induces two kinds of surface reconstructions: 2×4 and a striped pseudo 2×7 phase. The morphology of the 2×4 is similar to the 2×4 phase induced by other rare earth metals. The pseudo 2×7 phase has some common structural elements with the conventional 2×7 phase but shows a broad width distribution. Growth of silicide islands and nanowires is seen at higher metal coverages after post deposition annealing. Differences in behavior with respect to other rare earth metals can be attributed to differences in the stable bulk silicides in this system. ► We have studied the growth of Thulium on Si(001) by STM. ► Thulium forms silicide nanowires as well as surface reconstructions. ► The pseudo (2×7) surface reconstruction is unique to this system. ► Tm silicide nanowires are more stable during post deposition annealing.
ISSN:0039-6028
1879-2758
DOI:10.1016/j.susc.2011.08.001