Analytical techniques for trace element analysis: an overview

Techniques for the analysis of trace elements have developed rapidly in response to the increasing need for accurate measurements at extremely low amount of contents in diverse matrices. We review potentiometric, voltammetric, atomic spectrometric, X-ray and nuclear techniques and discuss the extent...

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Bibliographic Details
Published in:TrAC, Trends in analytical chemistry (Regular ed.) Trends in analytical chemistry (Regular ed.), 2005-03, Vol.24 (3), p.266-274
Main Authors: Brown, Richard J.C., Milton, Martin J.T.
Format: Article
Language:English
Subjects:
Limit of detection
Method comparability
Systematic bias
Trace analysis
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Summary:Techniques for the analysis of trace elements have developed rapidly in response to the increasing need for accurate measurements at extremely low amount of contents in diverse matrices. We review potentiometric, voltammetric, atomic spectrometric, X-ray and nuclear techniques and discuss the extent to which they have been shown to give comparable results in typical applications.
ISSN:0165-9936
1879-3142
DOI:10.1016/j.trac.2004.11.010