Characterization of asymmetric rhombohedral twin in epitaxial α-Cr2O3 thin films by X-ray and electron diffraction

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Bibliographic Details
Published in:Thin solid films 2007-04, Vol.515 (11), p.4570-4579
Main Authors: MANDAR, Hugo, UUSTARE, Teet, AARIK, Jaan, TARRE, Aivar, ROSENTAL, Arnold
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Structure and morphology
thickness
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
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ISSN:0040-6090
1879-2731
DOI:10.1016/j.tsf.2006.11.037