Loading…

Complex electrical (impedance/dielectric) properties of electroceramic thin films by impedance spectroscopy with interdigital electrodes

The complex electrical properties of isotropic, electroceramic thin films can be measured with interdigital electrodes, analyzed by impedance spectroscopy (IS). A periodic two-dimensional film/interdigital electrode (IDE) structure was simulated by finite-difference numerical method and a generalize...

Full description

Saved in:
Bibliographic Details
Published in:Thin solid films 2007-04, Vol.515 (11), p.4588-4595
Main Authors: Kidner, N.J., Meier, A., Homrighaus, Z.J., Wessels, B.W., Mason, T.O., Garboczi, E.J.
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The complex electrical properties of isotropic, electroceramic thin films can be measured with interdigital electrodes, analyzed by impedance spectroscopy (IS). A periodic two-dimensional film/interdigital electrode (IDE) structure was simulated by finite-difference numerical method and a generalized model was developed to characterize the electrical properties of thin films. Variable frequency simulations showed that the film/IDE system can be modeled as a parallel resistor–capacitor equivalent circuit. Equations were developed to extract from the equivalent circuit's fitted resistance and capacitance, the materials properties of the thin film, both conductivity and permittivity. The electrical properties of a polydomain BaTiO 3 film grown on a MgO substrate were measured with an IDE structure by IS to demonstrate how the methodology can be readily used.
ISSN:0040-6090
1879-2731
DOI:10.1016/j.tsf.2006.11.038